PCB SolderMask-Finished Pattern Inspection system

Performance

Low cost and High efficiency

Low cost and High efficiency, but still has excellent matching function of the system.

Without waiting and immediately inspect

After setup first golden data, put on the other part and then immediately inspected, Capturing len scans the defect position and then stop for checking. Instead of AVI system which must finish scanning and then processing to review station.

Quickly set up

Parameter setting is easy, set the parameters time is less than 5 minutes, get the new part no. to start inspection, no more than 5 minutes.

Inspection the type of defect

• Line below the solder mask layer: irregular rupture / link.
• Bond Finger：nickel layer thickness is insufficient.
• Bonding Finger size
• Copper-clad surface：gold misplating、Scratches、dent、missing、poor printed、contaminants.
• Solder mask smear
• Solder mask：Foreign object Scratches, Crack, crease.
• Solder ball：solder ball scratches.
• Solder mask：Foreign object Scratches, Crack, crease.

Function of Design Rule Check

To determine defect by user's parameters and system embedded logic. Simple operation and no need reference required Inspect irregular cut/connection, pinhole, dirt, irregular depression/raised, failure of line/space width etc.

Function of laser marking defects

Marking defect distribution location, laser indicator, output defect distribution map, coordinate's file.

Purpose

Inspect defects on the PCB by optical lens capturing system. The inspection system can reduce damages and promote product quality.

Operating principle

Analog microscope to take the principle of image, the use of high-energy front projection, side projection light source to be detected, through the precision optical lens group, focusing to the top of the high-resolution sensor system to obtain images, and then use the computer to convert the image into digital values, then use the following model to identify defects.

• Golden Sample inspection Mode: for the same area of the capture image, select the best sample, two-image contrast, to accurately identify defects, when checking defect the best sample at any time through a simple operation alternative, the best sample can also be used repeatedly.