FAQ

FAQs

1. It is possible to preserve the records, defect images, used time, inspection parameters of previous testing ?

Yes. All necessary testing data are preserved. History records include parameters, used time, test area, software version, and defect images.

Good film quality enhance product quality, decreases bad solder and waste, because human eye testing often misses numerous defects on films like broken line, pin hole, scratch, circuit nick, protrusions, dirt, water stain shade, etc. So checking by film/photomask inspection system is very common in the field.

1. Taking back light source as inspecting light source.
2. Using DRC to inspect irregular and violation minimum width and spacing.
3. Image comparison function. To compare the prompt image with reference data.
4. Super series with autofocus.

1. Guaranteeing to inspect irregular circuit like dirt, pinhole, scratch, violation minimum width and spacing.
2. Ignored Model Verify which established same shapes to ignore Net. and angles on the circuit.
3. Using DRC & Ignored model verify to avoid false defect and sharp angles.

To compare the reference data’s network topology before and after edit. To ensure the data won't cause faults by human editing. We aim to inspect the circuit whether there is open, short, miss, extra.

1. DX6.0 includes DRC inspection mode and measurement functions.
2. DX6.5 includes the functions of DX6.0 besides adding data reference inspection system and Net. Comparison. It can also check the expand ratio in flim/photomask.

TSL-FVT-DX6 Super High inspects the photomask with Line/Space(Critical Dimension) down to 6um. TSL-FVT-DX6.5 inspects film/photomask with Line/Space down to 15um

The magnification of lens is 20X. The resolution is 0.36µm/pixel.

1. Reference Data free inspection mode. The DRC inspection mode do not need reference data and alignment.
2. Parameters set in detection can be applied flexibly, and different types of defects can be detected.
3. Ignored Model Verify can ignored spots and sharp angles to avoid false defects.

The Line/Space width (Critical Dimension) of TSL-FVT-DX6 Super High Plus is 4.5um/0.18mil. 。

1. Marking box with different color to show various defects on screen.
2. Adjustable fonts and marking box size by parameter setting.

In accordance with the system specifications.

After adjusting magnification, system will auto calculate a parameter for using. Then you can adjust parameter in detail. Any parameter modification will change the detected result immediately.

Yes. We provide round, square, line width /space width and Long distance measurement.

The accuracy in ±1(pixel). Use the higher resolution the precision is higher.

Yes. The system is equipped with a laser indicator. It's easy to find out the position of capturing image.

Using die to data function needs to concern the problem of film shrunk.

The system use AC single phase 220V 60HZ.

To make sure that system won't be shut down by accident. We backup system and test program in dual HDD.

Ignored Model Verify can ignored spots and sharp angles to avoid false defects.

The value stands for diameter in same areas’ circle.

Data reference mode adopts the function of die to data to compare. To compare the scanning image with reference data. We emphasized that lost PAD on the film; image shifted and the change of image size. Furthermore DRC could be performed in the same time.

Work station of data reference is for pre-processing and editing before data reference inspection mode. It can work independently without main system.

We develop the function of ignored model verify, ignored blank area, non-inspection which can ignore special shape, circuit to inspect.

DX6.0 and DX6.5 both includes mark stamping function. The red ink of stamping mark is for silver halide film. The blue ink of stamping mark is for diazo film.

Our warranty is 1 year. In the warranty period, we will keep updating our software to protect the customer's rights.

We can read ODB++、Gerber data (RS274X)、DXF format, GDSII etc. We develop software by ourselves. ODB++ is the main stream in the field. We have invested quite resource for developing ODB++ and made its compatibility perfectly.

Yes.
1.Both DRC and data reference are isolated inspection system. DRC used to inspected small particles like scratch, dirt.... etc.
2.Data reference emphasized that lost PAD on the film; image shift and the change of image size.

Absolutely. Before scanning, you can create saving fold with any name freely. In accompany with large capacity of HDD, you can check scanned result anytime.

Please don't worry. We can store the defects over one million or more by our system which has already surpassed inspecting standard. You don’t need to worry about that if you use our equipment.

1. It is possible to preserve the records, defect images, used time, inspection parameters of previous testing ?

Yes. All necessary testing data are preserved. History records include parameters, used time, test area, software version, and defect images.

1. AVI system can’t support to inspect lots of defect types. The most common AVI system can detect foreign object on solder mask, copper/gold peeling, scratch etc. The setting time is too long.
2. Electrical Test is not valid : Generally for the convenience of the process, the first line will be deliberately short-circuit together and blow or cut off before the shipment, so not all lines can rely on electrical measurement to check.
3. Incoming Quality Control generally depend on human eyes inspection, but people can detect foreign objects on solder mask only. They cannot find defects under the solder mask.

1. DVI is a technology of automated optical inspection, which can inspect deep to the differencefrom semi-transparent layers or semi-reflective layers.
2. DVI equip with a designed optical light path and a specified wave length projection light to control going through a semi-transparent/semi-reflective layer or not, then achieve doing deep vision inspection.
3. This make DVI is different from AOI and AXI. In general, AOI (Automated Optical Inspection) indicates defects on object surface, and AXI (Automated X-Ray Inspection) indicates defects in object inside.

1. Die to Die Detect mode means comparing two Dies in neighbor Dies then detectthe difference, then our system will determine difference as failed.
2. We define the perfect Die as the Golden Sample, if other Dies which have difference with golden sample, then our system will determine as failed.

The minimum Line/Space width (Critical Dimension) is 15 um.

1. Marking box with different color to show various defects.
2. Adjustable fonts and marking box size by parameter setting.

In accordance with the system specifications.

The system use AC single phase 220V 60HZ.

To make sure that system won't be shut down by accident. We backup system and test program in dual HDD.

Our warranty is 1 year. In the warranty period, we will keep updating our software to protect the customer's rights.

1. What is the maximum inspection area of Metal Mask/Stencil ?

The platform is 750mm × 750mm × 50(H)mm. Inspection area is 750mm × 750mmm.

Pin hole, the extra or missing aperture/hole, aperture too closing, aperture shift, dust, protrusion.

No.

No.

No.

Yes. We provide long distance measurement, round aperture measurement, square aperture measurement, the closet distance measurement.

±1 pixel error.

30um.

Yes. The system is equipped with a laser indicator.. It's easy to find out the position of capturing image.

The system use AC single phase 220V 60HZ.

Yes. It's easy to find big and complete defect, such as dust in hole.

Less than 1 mins. (Inspection area:750mm × 750mm; the magnification=1X)

To compare with reference data and find out the difference.

1. What kind can be repaired ?

ITO, silver halide(ITO glass mask)

680*540mm

1um~50um

1-5mJ/pulse

We provide film repair ink for repairing film. Using the pen to touch a little bit repair ink and repair film. The repair refill ink is quick-drying.

2-4Kg

The system use AC single phase 220V 60HZ.

No. Using co-axis to find out the defects location for repairing In accompany with laser simulation light control.

It's for repairing the metal dirt and nonexistent circuits.

We use electro-motion adjustment. Adjustable range is 100mm.

During repairing it use 20X lens.

Please wear the goggles before repairing.

Yes.

From half a year to 1 year.

Yes.

1. Why do we use Fixture Design System ?

Due to the vast majority of PCB layouts and Nets, selecting the test points by human can’t catch up with the PCB trend anymore. The purpose of using Fixture Design System is that analyzing by computer can make sure the relation between correct Nets. and test points.

1. Make sure the Gerber Data import format. For example：Units error：Thedata is the imperial units, but set as metric unit in program. Format error：the data is 2-4 format, but program set as 3-3 format.
2. Wrong DCode format.

1. WTS-NASX repair station is free charge which is only for review test points without editing function. So you need to use repair data exported from WTS-NAS.
2. WTS-NAS related repair data format as follows :
(1) LM-OBJ Data (*.OBJ)
(2) GC-CAM Data(*.IPC/*.NTD)
(3) PAR-CAM Data(*.IPC/*.NTD)
(4) U-CAM Data(*.IPC/*.NTD)
(5) IPC-D-356A Data(*.356)，(*.IPC)
(6) Fabmaster Parts Data(*.ASC)

1. PCB/BaredBoard test system：UTRON、KYOEI、TAIYO、FOREVER、MASON、TTI、PANTECH、READ
2. ICT/MDA test system：TRI518、QKANO、TRI-Board View、JET

To make sure the repair mode setup, whether the setup has been changed or not.
For example：Input Number with dedicate Mode or Universal Mode.

WTS-1000 fixture system is for Bare Board. The selected test points will locate on each end of Nets.
WTS-2000 fixture system is for ICT/MDA. There is only one test point on one Net.

1. Dedicate Mode
2. Universal Mode
3. Real ID Mode
4. Read Mode
5. Panel Distance Mode
6. Aps net Mode

1. SHINDENSHI
2. ATG/ AFF+ATF
3. MANIA SPEEDY(*.ADJ / *.SDE)
4. PROBOT(*.HLS / *.NET)

1. IPC-D-356(*.IPC)
2. P-CAD(*.PDF)
3. PADS(*.ASC)
4. PROTEL(*.PCB)
5. MEMTOR GRA(*.FIL)
6. ZUKEN(*.TKY，*.PRT)
7. BOM Data(*.BOM，*.TXT)
8. FABMASTER(*.ASC)
9. CADENCE(*.ICT)
10. Re-Sorted Data(*.RPT)

1. ATG Data(*.ZUO, *.REF)
2. L/M Data(*.UDL)
3. Mania Data(*.PIN)
4. Circuit Line Data(*.SRI)
5. Olitec Data(*.DSP)
6. UCAM/ Circuitline(*.UDL)
7. JMT Data(*.ANZ)

To select "Parameter setting"→ "Display Nets." End users can inspect the big Net by themselves under the WTS-NASX.

To select "ADD/Delete point" under the TSF Editor or WTS-3000 system.
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